Semiconductor Testing Instrument
Model | Description |
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CG High And Low Temperature Vacuum Probe | High and low temperature test in vacuum environment (4.2K~450K).High frequency characteristics of the device (supports up to 67GHz frequency).Support optical fi... |
SCG launched series | SCG launched series is the first domestic company independent research and development of high and low temperature vacuum prober, in ultra high vacuum, automati... |
A Series Full Automatic Probe Station | A series is SEMISHARE years carefully developed a production automatic high and low temperature probe, the probe station has high test precision and super fast ... |
X12 "Semi-Automatic Probe Station | X series is an integrated and highly efficient semi-automatic wafer probe platform that is specialized in testing the performance of various advanced chips. It ... |
C series Prober | C series prober has excellent mechanical system, stable structure and performance, ergonomic design, easy operation, support multi-function upgrade, rich and co... |
H12"Integrated Manual Probe Station | H series is a high-end comprehensive manual test probe configuration, the device has excellent stability and maneuverability, and the test precision are higher ... |
E Series 150mm Economical Manual Probe Station | E series prober has excellent mechanical system, stable structure and performance, ergonomic design, more convenient operation, support multi-function upgrade, ... |
M4" Basics Manual Probe Station | A Basics type based on the university education and laboratory test wafer prober, this equipment is mainly applied in the semiconductor industry, as well as tes... |
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