X12 "Semi-Automatic Probe Station
X12 "Semi-Automatic Probe Station
Summary:
Basic
Information
Product number |
X12 |
Working environment |
Open
type |
Electricity demand |
220V,50~60Hz |
Control method |
Semi-Automatic |
Product Size |
1060mm*1610mm*1500mm |
Equipment weight |
About
1500 kg |
Application
direction
Equipment professional deal with 12
"8" 6 "wafer Si/GaN/SiC and other kinds of devices of advanced
chip performance test, can be equipped with corresponding instruments and
meters, for the I - V C - V light RF signal character such as 1 / f noise
analysis, feature-rich devices, scalable high-power wafer test RF test
automatic test, and can load temperature control system, satisfy the customer
in the high and low temperature environment of all kinds of wafer device
performance test requirements.
Technical
characteristics
The industry's most efficient CHUCK system, test
efficiency increased by more than 40%
● The industry's most
efficient CHUCK test system running speed & GT;70mm/s, motion precision 1
m, while moving the translocation time index time 500ms, excellent system
operating parameters have reached the highest level of the industry, ultra-high
test accuracy and efficiency to meet all kinds of wafers and devices of high
repeatability and stability test, compared with other probe brands in the
industry, the test efficiency is effectively increased by more than 40%. ●-60 ~300 is the highest temperature wide area in the industry, with
temperature control accuracy and stability better than 0.08, providing
reliability wafer testing in high and low temperature environments. ●The compact structure design of four-dimensional motion with low
center of gravity ensures the motion speed of 70mm/s while maintaining the
stability of motion acceleration and deceleration.
Industry leading 3 times imaging technology
Built-in SEMISHARE patent more than
three zoom microscope view three times with JiaoGuang road system, 120 x 2000 x
variable times optical amplifier, size view shows at the same time, more can
make the point needle and convenient operation, double Basler 2 million pixels
high speed CCD 23 "display and Mituyoyo high precision high resolution
camera, precision positioning of high stability high definition, image output
and high precision measurement and dynamic monitoring.
Auxiliary CHUCK module silicon wafer safe upper and lower
●The unique Chuck XY axis
design in the industry has changed the common phenomenon that the probe system
of other brands in the market is affected by the resistance of laminated plates
in different directions and sizes, leading to the decline of motion stability.This
ensures that the XY axis is not affected by the laminate when moving, making
the motion precision and stability higher. ●Compared
with other brands in the industry, the probe table cavity of SEMISHARE can be
opened once and pulled out the entire Chuck mechanism to load and load silicon
wafers at a speed of 370mm with a long stroke. The manual feeding of the Wafer
is more convenient and faster.Meanwhile, the Chuck's rotation Angle range is
larger, which requires lower demand for manual laying wafer, and the operation
is more flexible and convenient.
Design of O-type needle seat platform
The probe testing system adopts the
O-type needle seat platform design, which makes the most efficient use of the
space of the needle seat, up to 12 needle seats can be placed at the same time.
Compared with other probe brands in the market, the number of the needle seat
is increased by 50%, effectively realizing more efficient and rapid testing.
Air film shock absorption system
The industry's unique internal
integration of high-performance air film shock absorption system and the dual
design of the external isolation barrier, effectively avoid the vibration
caused by the operator's touch;In addition, a long-aging casting is used as the
substrate to suppress the vibration in the process of motion at the fastest
speed of 1S in the industry to ensure the stable operation of the equipment,
and to ensure that the screen does not shake when the image is enlarged at
2000X;At the same time, the high-precision control valve ensures that the
height error of the moving part of the platform is 0.1mm, effectively realizing
the test ability of fast DIE to die, ensuring that the whole system can still
maintain a stable running state when moving at a high speed, and greatly
improving the test efficiency.
Anti-interference shielding system
Anti interference EMI/Spectral
noise/external light closed shielding cavity, cavity with the surface of
conductive oxide and nickel plating process, to ensure the conduction state
between the parts so as to achieve the shielding effect, reduce the system
noise, blocking interference effectively, and provide low leakage current
protection, provides the best test environment for the weak electric signal
test;At the same time, the closed chamber in the low temperature environment to
avoid the test sample condensation, to ensure the wafer and device under the
high and low temperature environment fast and safe reliability test.
Independent research and development of software
integration system, more compatibility
●Support semi-automatic
control (manual test or automatic test). ●Automatic
Wafer calibration automatic Wafer mapping automatic die size measurement
automatic align automatic test data can be accessed remotely. ●Automatic calibration of RF probe module with one key, automatic
needle clearing function. ●One-key adaptive four-axis
Chuck precision calibration, supporting micron pad point measurement. ●Single point or continuous testing can be supported. ● Strong data storage capacity and data processing capacity. ●The bin value can be divided to determine the device NG. ●Multi-system integration to upgrade the operating system application
system and device test system independently. ●Intuitive
and simple operation design, quick and easy operation, effective saving
operation training time.
Flexible optional configuration and extension
Convenient instrument access and
support system automatic expansion and upgrade, temperature control system
loading;There are also a variety of test modules available. According to the
test module, it can be used together with a variety of positioner fixtures,
needle CARDS and probe tables, such as six-axis positioner RF cables.Many
system operating parameters and features reach the highest level of the
industry, can meet your different test needs, but also an ideal choice for more
industry customers a semi-automatic probe table equipment.