H12"Integrated Manual Probe Station

H12"Integrated Manual Probe Station


Basic Information

Product number


Working environment

Open type

Electricity demand


Control method

Manual Probe Station

Product Size

1300MM long *920MM wide *920MM high

Equipment weight

About 300 kg

Application direction

It is suitable for scientific research and analysis of nano micro devices, spot check and detection, etc., to quickly analyze and test the circuit of the chip on the wafer and judge the product performance by the electrical parameters, and then reduce the loss of the chip defects to the product, so as to improve the yield and carry the rf characteristic test and upgrade and carry the optical fiber spectrum characteristic test.