A Series Full Automatic Probe Station
A Series Full Automatic Probe Station
Summary:
Basic
Information
|
Product number |
A8, A12 |
Working environment |
Open
type |
|
Electricity demand |
220 V,
50/60Hz |
Control method |
Full-Automatic |
|
Product Size |
A8(1124
x 1111 x 925) ；A12(1600
x 1660 x 1450) |
Equipment weight |
1.2T, 2T |
Application
direction
Wafer testing of various kinds of
devices Wafer and other Wafer performed RF testing and other characteristics
analysis of I-V C-V optical signal RF 1/ F noise, etc.
Technical
characteristics
A8 Full Automatic Prober
●High precision and test speed, greatly improving test efficiency
●Micron-scale fully closed-loop motion control
●High voltage and high current test application
●Bernoulli arm support sheet
●Small size, light weight, smaller footprint
●24X7 hours
on-chip detection
A12 Full Automatic Prober
●Super high test precision and test speed, greatly improve productivity benefits.
●Fully automated system running, fast safe and reliable test.
●Support single point testing and continuous testing.
●Integrated control system, fast access to instrument testing.
●CHUCK efficient test system, running speed exceeding 300mm/s.
●Rich software automation test, precise mechanical precision calibration.
●Automatic wafer thickness measurement and ID reading card can be upgraded.
●Leading internal anti - shock system device, more stable operation.
